A lot of exciting ideas are followed by scientists and researchers all around the world on advanced photovoltaics searching for new solution in photoconversion, light trapping and novel collecting structures  the so called “field of dreams where the research concepts and technology require the PV researchers’s creativity,  patience and funding to prove or develop concepts”.

Focused ion beam (FIB), is a well established technique used particularly in the semiconductor industry, materials science and  biological field for specific analysis, deposition, and ablation of materials can   represent a very useful “ab inizio” technique to prove in very short time new  concepts on advanced photovoltaics  before making investment in their further development and searching for cost effective solution.

Focused ion beam (FIB), is a well established technique used particularly in the semiconductor industry, materials science and  biological field for specific analysis, deposition, and ablation of materials. Its operating mechanism relies on a highly focused and energetic gallium ion beam that hits the surface of the substrate for machining materials at nanoscale and to make very accurate cross section of a sample/devices for SEM, STEM or TEM applications.

FIB is also finding very  wide application for rapid processing and prototyping of nano-scale devices with very high reproducibility and flexibility. FIB can also represent a very useful “ab inizio” technique to prove in very short time new  concepts on advanced photovoltaics  before making investment in their further development and searching for cost effective solution.

The webinar is divided into two parts